Abstract: Starting from testing work, the application of partial technical index and test methods in nondispersive atomic fluorescence spectrophotometer verification to new high-sensitive and indelligent instruments was discussed, and relative amending proposals were submitted. It was proved to be actual through acute metrological verification. The problems that the method can’t be undertaken or test index was not suitable to the test demands in real work were resolved. It is guaranteed that the instrument can give accurately and impartially analytical results after metrological verification.