Abstract: A high capability Philips PW2424 wavelength dispersive X-ray fluorescence spectrometry was used to test the elements’ concentrations in aluminum alloy architecture materials such as Si, Fe, Cu, Mn, Mg, Zn, Ti, Cr and Ni. Calibration curves were obtained and the correction factor of interference elements and for matrix effects of elements were calculated. From the quantitative results the method of direct multi-element WDXRF determination in aluminum alloy architecture materials was improved and it provides sufficient accuracy and precision for this kind of analysis.