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测定ZSM—5分子筛SiO2/Al2O3比的X射线衍射分析新方法

SiO2/Al2O3 Ratio of ZSM-5 Zeolite Determined by X-Ray Diffraction Analysis

    摘要
  • 摘要: 用X射线衍射最小二乘法测定ZSM-5分子筛的晶胞参数,由SiO2/Al2O3比与品胞体积之间的经验公式,可得到ZSM-5分子筛的SiO2/Al2O3比.实验结果分析表明,该方法测定的ZSM-5分子筛SiO2/Al2O3比较通常采用的化学分析法省时、简便、重复性好.

     

    Abstract: ZSM-5 Zeolite was examined with a Japan diffractomcter (D max-RB X-Ray Diffractometer). The data obtained were boied by means of the least square method to give the Cell volume of the zeolite. According to an empirical formula correlating the Cell volume with the SiO2/Al2O3 ratio, the latter can be easily obtained. This method is simpler and convenient and itS repeatabillty is better than common chemical analysis.

     

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