Abstract: The use of Cryo-focused ion beam milling (Cryo-FIB) to prepare the cryo-lamellae opens a window for the study of in situ cellular structure. The quality of the lamellae will directly affect the data collection and processing of cryo-electron tomography. Since there are still different problems in the application of the technology, we summarized some relative solutions published in recent papers, in order to provide references for researchers doing Cryo-FIB experiments.