詹美燕, 李春明. X射线衍射测试样品位置对谱线峰位和强度的影响[J]. 分析测试技术与仪器, 2020, 26(2): 132-137. DOI: 10.16495/j.1006-3757.2020.02.009
引用本文: 詹美燕, 李春明. X射线衍射测试样品位置对谱线峰位和强度的影响[J]. 分析测试技术与仪器, 2020, 26(2): 132-137. DOI: 10.16495/j.1006-3757.2020.02.009
ZHAN Mei-yan, LI Chun-ming. Effects of Sample Position on Peak Position and Intensity of Spectrum During X-ray Diffraction Test[J]. Analysis and Testing Technology and Instruments, 2020, 26(2): 132-137. DOI: 10.16495/j.1006-3757.2020.02.009
Citation: ZHAN Mei-yan, LI Chun-ming. Effects of Sample Position on Peak Position and Intensity of Spectrum During X-ray Diffraction Test[J]. Analysis and Testing Technology and Instruments, 2020, 26(2): 132-137. DOI: 10.16495/j.1006-3757.2020.02.009

X射线衍射测试样品位置对谱线峰位和强度的影响

Effects of Sample Position on Peak Position and Intensity of Spectrum During X-ray Diffraction Test

  • 摘要: 鉴于X’Pert Pro MRD多晶X射线衍射仪的样品台5维可移动,研究了样品的位置对物相测试中谱线峰强度和峰位的影响.结果表明,样品表面低于或者高于光路中心,都会造成谱图峰位的偏移,对峰强度影响不明显.当样品表面低于光路中心位置时,峰位呈减小趋势.当样品表面高于光路中心位置时,峰位呈增加趋势.当水平位置放置了不同厚度的样品进行批处理测试时,谱线的峰强度会受到最厚的样品的影响,峰位的变化不明显.

     

    Abstract: The X'Pert Pro MRD cradle can provide five motorized movements. The effects of sample position on the peak position and intensity of spectrum during the X-ray diffraction (XRD) test were studied. Results showed that the peak position of the spectrum would shift when the surface of the sample is lower or higher than the center of the optical path, while the peak intensity would not be significantly affected. The peak position would show a decreasing or increasing trend depending on whether the surface of the sample is lower or higher than the central position of the optical path. The peak intensity of spectrum would be affected by the thickest sample when samples with different thicknesses are placed horizontally for batch testing, while the change of peak position is not obvious.

     

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